Direct laser patterning of ruthenium below the optical diffraction limit

Lorenzo Cruciani*, Marnix Vreugdenhil, Stefan van Vliet, Ester Abram, Dries van Oosten, Roland Bliem, Klaasjan van Druten, Paul Planken

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

We describe a method that can be used to produce ruthenium/ruthenium oxide patterns starting from a ruthenium thin film. The method is based on highly localized oxidation of a small surface area of a ruthenium film by means of exposure to a pulsed laser under ambient conditions. Laser exposure is followed by dissolution of the un-exposed ruthenium in a NaClO solution, which leaves the conductive, partially oxidized ruthenium area on the substrate. Spatially selective oxidation, material removal, and, by implication, patterning, are, therefore, achieved without the need for a photoresist layer. Varying the exposure laser parameters, such as fluence, focus diameter, and repetition rate, allows us to optimize the process. In particular, it enables us to obtain circular Ru/RuO2 islands with a sub-diffraction-limited diameter of about 500 nm, for laser exposure times as short as 50 ms. The capability to obtain such small islands suggests that heat-diffusion is not a limiting factor to pattern Ru by laser heating on a (sub-)micron scale. In fact, heat diffusion helps in that it limits the area where a sufficiently high temperature is reached and maintained for a sufficiently long time for oxidation to occur. Our method provides an easy way to produce metallic Ru/RuO2 (sub-)micron structures and has possible applications in semiconductor manufacturing.

Original languageEnglish
Article number171902
Number of pages6
JournalApplied Physics Letters
Volume124
Issue number17
DOIs
Publication statusPublished - 22 Apr 2024

Bibliographical note

Publisher Copyright:
© 2024 Author(s).

Funding

This work was partly conducted at the Advanced Research Center for Nanolithography, a public-private partnership between the University of Amsterdam (UvA), Vrije Universiteit Amsterdam (VU), Rijksuniversiteit Groningen (RUG), the Netherlands Organization for Scientific Research (NWO), and the semiconductor equipment manufacturer ASML. Marnix Vreugdenhil and Ester Abram acknowledge the financial support by the project \u201CWafer damage control: Understanding and preventing light-induced material changes in optical measurement systems\u201D (with Project No. 17963) of the research program High Tech Systems and Materials (HTSM), which is (partly) financed by the NWO.

FundersFunder number
Universiteit van Amsterdam
Nederlandse Organisatie voor Wetenschappelijk Onderzoek17963

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