Determination of photoelectron attenuation lenghts in thin oxide films on iron surfaces using quantitative XPS and elastic recoil detection

S.J. Roosendaal; I.A.M.E. Giebels; A.M. Vredenberg; F.H.P.M. Habraken

Determination of photoelectron attenuation lenghts in thin oxide films on iron surfaces using quantitative XPS and elastic recoil detection

S.J. Roosendaal, I.A.M.E. Giebels, A.M. Vredenberg, F.H.P.M. Habraken

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Research output: Contribution to journal › Article › Academic › peer-review

Original language	Undefined/Unknown
Pages (from-to)	758-765
Number of pages	8
Journal	Surface and Interface Analysis
Volume	26
Publication status	Published - 2001

Cite this

@article{00d7a0eb1bb94e08842e819992991566,

title = "Determination of photoelectron attenuation lenghts in thin oxide films on iron surfaces using quantitative XPS and elastic recoil detection",

author = "S.J. Roosendaal and I.A.M.E. Giebels and A.M. Vredenberg and F.H.P.M. Habraken",

year = "2001",

language = "Undefined/Unknown",

volume = "26",

pages = "758--765",

journal = "Surface and Interface Analysis",

issn = "0142-2421",

publisher = "John Wiley and Sons Ltd",

}

TY - JOUR

T1 - Determination of photoelectron attenuation lenghts in thin oxide films on iron surfaces using quantitative XPS and elastic recoil detection

AU - Roosendaal, S.J.

AU - Giebels, I.A.M.E.

AU - Vredenberg, A.M.

AU - Habraken, F.H.P.M.

PY - 2001

Y1 - 2001

M3 - Article

SN - 0142-2421

VL - 26

SP - 758

EP - 765

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

ER -