Abstract
A new probabilistic approach is introduced for the determination of the
absolute structure of a compound which is known to be enantiopure based on
Bijvoet-pair intensity differences. The new method provides relative probabilities
for different models of the chiral composition of the structure. The outcome
of this type of analysis can also be cast in the form of a new value, along with
associated standard uncertainty, that resembles the value of the well known
Flack x parameter. The standard uncertainty we obtain is often about half of the
standard uncertainty in the value of the Flack x parameter. The proposed
formalism is suited in particular to absolute configuration determination from
diffraction data of biologically active (pharmaceutical) compounds where the
strongest resonant scattering signal often comes from oxygen. It is shown
that a reliable absolute configuration assignment in such cases can be made
on the basis of Cu Kα data, and in some cases even with carefully measured
Mo Kα data.
Original language | Undefined/Unknown |
---|---|
Pages (from-to) | 96-103 |
Number of pages | 8 |
Journal | Journal of Applied Crystallography |
Volume | 41 |
Publication status | Published - 2008 |