Detection of aberrant item score patterns: a review of recent developments

R.R. Meijer, K. Sijtsma

Research output: Contribution to journalArticleAcademicpeer-review

Original languageUndefined/Unknown
Pages (from-to)261-272
Number of pages12
JournalApplied Measurement in Education
Publication statusPublished - 1995


  • Evaluation and measurement in psychology
  • Sociale wetenschappen
  • Methoden, technieken en organisatie van sociaal-wetenscha

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