Conductivity mapping of nanoparticles by torsional resonance tunneling atomic force microscopy

C Prastani; A. Vetushka; A. Fejfar; M. Nanu; D. Nanu; J.K. Rath; R.E.I. Schropp

doi:10.1063/1.4744601

Conductivity mapping of nanoparticles by torsional resonance tunneling atomic force microscopy

C Prastani, A. Vetushka, A. Fejfar, M. Nanu, D. Nanu, J.K. Rath, R.E.I. Schropp

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Abstract

In this paper, torsional resonance tunneling mode atomic force microscopy is used to study the conductivity of nanoparticles. SnS nanoparticles capped with trioctylphosphine oxide (TOPO) and with In2S3 shell are analyzed. This contactless technique allows carrying out measurements on nanoparticles without destroying them and to obtain simultaneously topography and conductivity maps. This made it possible to achieve complete characterization of individual particles in a single measurement. The results demonstrate that the particles have conductive properties. The results have also showed that the TOPO capping layer may hinder tunneling currents, therefore should be avoided when performing these measurements.

Original language	English
Article number	083107
Pages (from-to)	083107/1-083107/5
Number of pages	5
Journal	Applied Physics Letters
Volume	101
DOIs	https://doi.org/10.1063/1.4744601
Publication status	Published - 2012

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title = "Conductivity mapping of nanoparticles by torsional resonance tunneling atomic force microscopy",

abstract = "In this paper, torsional resonance tunneling mode atomic force microscopy is used to study the conductivity of nanoparticles. SnS nanoparticles capped with trioctylphosphine oxide (TOPO) and with In2S3 shell are analyzed. This contactless technique allows carrying out measurements on nanoparticles without destroying them and to obtain simultaneously topography and conductivity maps. This made it possible to achieve complete characterization of individual particles in a single measurement. The results demonstrate that the particles have conductive properties. The results have also showed that the TOPO capping layer may hinder tunneling currents, therefore should be avoided when performing these measurements.",

author = "C Prastani and A. Vetushka and A. Fejfar and M. Nanu and D. Nanu and J.K. Rath and R.E.I. Schropp",

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T1 - Conductivity mapping of nanoparticles by torsional resonance tunneling atomic force microscopy

AU - Prastani, C

AU - Vetushka, A.

AU - Fejfar, A.

AU - Nanu, M.

AU - Nanu, D.

AU - Rath, J.K.

AU - Schropp, R.E.I.

PY - 2012

Y1 - 2012

N2 - In this paper, torsional resonance tunneling mode atomic force microscopy is used to study the conductivity of nanoparticles. SnS nanoparticles capped with trioctylphosphine oxide (TOPO) and with In2S3 shell are analyzed. This contactless technique allows carrying out measurements on nanoparticles without destroying them and to obtain simultaneously topography and conductivity maps. This made it possible to achieve complete characterization of individual particles in a single measurement. The results demonstrate that the particles have conductive properties. The results have also showed that the TOPO capping layer may hinder tunneling currents, therefore should be avoided when performing these measurements.

AB - In this paper, torsional resonance tunneling mode atomic force microscopy is used to study the conductivity of nanoparticles. SnS nanoparticles capped with trioctylphosphine oxide (TOPO) and with In2S3 shell are analyzed. This contactless technique allows carrying out measurements on nanoparticles without destroying them and to obtain simultaneously topography and conductivity maps. This made it possible to achieve complete characterization of individual particles in a single measurement. The results demonstrate that the particles have conductive properties. The results have also showed that the TOPO capping layer may hinder tunneling currents, therefore should be avoided when performing these measurements.

U2 - 10.1063/1.4744601

DO - 10.1063/1.4744601

M3 - Article

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VL - 101

SP - 083107/1-083107/5

JO - Applied Physics Letters

JF - Applied Physics Letters

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Conductivity mapping of nanoparticles by torsional resonance tunneling atomic force microscopy

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