Combining micro-CT data and XRF spectra for advanced element analysis

Matthieu Boone, Jan Dewanckele, Veerle Cnudde, Geert Silversmit, Kjeld Vandeputte, Gerald Ernst, Luc Van Hoorebeke, Laszlo Vincze, Patric Jacobs

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Earth and Planetary Sciences