Combined 3D chemical and morphological characterization using innovative lab-based equipment

Matthieu Boone; Brecht Laforce; Bert Masschaele; Manuel Dierick; Frederic Van Assche; Veerle Cnudde; Bart Vekemans; Laszlo Vincze; Luc Van Hoorebeke

doi:10.1017/s1431927618013247

Combined 3D chemical and morphological characterization using innovative lab-based equipment

Matthieu Boone, Brecht Laforce, Bert Masschaele, Manuel Dierick, Frederic Van Assche, Veerle Cnudde, Bart Vekemans, Laszlo Vincze, Luc Van Hoorebeke

non-UU output of DES-UU members

Research output: Contribution to journal › Meeting Abstract › Academic

Original language	English
Pages (from-to)	176-178
Number of pages	3
Journal	Microscopy and Microanalysis
Volume	24
Issue number	S2
DOIs	https://doi.org/10.1017/s1431927618013247
Publication status	Published - 2018
Event	14th International Conference on X-ray Microscopy (XRM2018) - Saskatoon, Canada Duration: 19 Aug 2018 → 24 Aug 2018

Access to Document

10.1017/s1431927618013247

Cite this

@article{512004bd09474e399dffb4e592b66c54,

title = "Combined 3D chemical and morphological characterization using innovative lab-based equipment",

author = "Matthieu Boone and Brecht Laforce and Bert Masschaele and Manuel Dierick and {Van Assche}, Frederic and Veerle Cnudde and Bart Vekemans and Laszlo Vincze and {Van Hoorebeke}, Luc",

year = "2018",

doi = "10.1017/s1431927618013247",

language = "English",

volume = "24",

pages = "176--178",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "S2",

note = "14th International Conference on X-ray Microscopy (XRM2018) , XRM2018 ; Conference date: 19-08-2018 Through 24-08-2018",

}

TY - JOUR

T1 - Combined 3D chemical and morphological characterization using innovative lab-based equipment

AU - Boone, Matthieu

AU - Laforce, Brecht

AU - Masschaele, Bert

AU - Dierick, Manuel

AU - Van Assche, Frederic

AU - Cnudde, Veerle

AU - Vekemans, Bart

AU - Vincze, Laszlo

AU - Van Hoorebeke, Luc

PY - 2018

Y1 - 2018

U2 - 10.1017/s1431927618013247

DO - 10.1017/s1431927618013247

M3 - Meeting Abstract

SN - 1431-9276

VL - 24

SP - 176

EP - 178

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S2

T2 - 14th International Conference on X-ray Microscopy (XRM2018)

Y2 - 19 August 2018 through 24 August 2018

ER -