Co-seismic nanoscale fault gouge deformation mechanisms revealed by automated crystal orientation mapping transmission electron microscopy (ACOM-TEM)

M. Ohl, Billy Nzogang, Patrick Cordier, M.R. Drury, O. Plümper

Research output: Contribution to conference › Abstract › Academic

Fingerprint

Dive into the research topics of 'Co-seismic nanoscale fault gouge deformation mechanisms revealed by automated crystal orientation mapping transmission electron microscopy (ACOM-TEM)'. Together they form a unique fingerprint.

Keyphrases

Earth and Planetary Sciences

Engineering

Material Science