CHARACTERIZATION OF SUBMONOLAYER GROWTH OF CU ISLANDS ON CU(001)

O BIHAM, M BREEMAN, DO BOERMA, G VIDALI, G.T. Barkema

Research output: Contribution to journalLetterAcademicpeer-review

Abstract

Submonolayer island growth of Cu on Cu(001) is simulated using energy barriers derived by the atom-embedding method of Finnis and Sinclair. We find that the island density during deposition quickly saturates and forms a plateau over a range of the coverage theta. We observe that due to high edge mobility the islands form compact shapes and that the average island size RBAR scales like RBAR approximately theta(n) where n almost-equal-to 0.5, in agreement with recent experiments.

Original languageEnglish
Pages (from-to)L569-L574
Number of pages6
JournalSurface Science
Volume306
Issue number3
Publication statusPublished - 10 Apr 1994

Keywords

  • SIZE DISTRIBUTION
  • SELF-DIFFUSION
  • AG/SI(111)
  • SURFACES
  • ADATOMS
  • METALS
  • NI
  • AL
  • AG
  • AU

Fingerprint

Dive into the research topics of 'CHARACTERIZATION OF SUBMONOLAYER GROWTH OF CU ISLANDS ON CU(001)'. Together they form a unique fingerprint.

Cite this