| Original language | English |
|---|---|
| Pages (from-to) | 801-807 |
| Number of pages | 7 |
| Journal | Analytical Chemistry |
| Volume | 82 |
| Publication status | Published - 2010 |
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C60+ secondary ion microscopy using a delay line detector
- L.A. Klerk
- , N.P. Lockyer
- , A. Kharchenko
- , L. MacAleese
- , P.Y.W. Dankers
- , J.C. Vickerman
- , R.M.A. Heeren
Research output: Contribution to journal › Article › Academic › peer-review