C60+ secondary ion microscopy using a delay line detector

L.A. Klerk, N.P. Lockyer, A. Kharchenko, L. MacAleese, P.Y.W. Dankers, J.C. Vickerman, R.M.A. Heeren

Research output: Contribution to journalArticleAcademicpeer-review

Original languageEnglish
Pages (from-to)801-807
Number of pages7
JournalAnalytical Chemistry
Volume82
Publication statusPublished - 2010

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