Original language | English |
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Pages (from-to) | 801-807 |
Number of pages | 7 |
Journal | Analytical Chemistry |
Volume | 82 |
Publication status | Published - 2010 |
C60+ secondary ion microscopy using a delay line detector
L.A. Klerk, N.P. Lockyer, A. Kharchenko, L. MacAleese, P.Y.W. Dankers, J.C. Vickerman, R.M.A. Heeren
Research output: Contribution to journal › Article › Academic › peer-review