Skip to main navigation Skip to search Skip to main content

Atomic XAFS as a Tool to Probe the Electronic Properties of Supported Noble Metal Nanoclusters

  • A.M.J. van der Eerden
  • , M.H. Visser
  • , T.A. Nijhuis
  • , Y. Ikeda
  • , M. Lepage
  • , D.C. Koningsberger
  • extern

Research output: Contribution to journalArticleAcademicpeer-review

Original languageUndefined/Unknown
Pages (from-to)3272-3273
Number of pages2
JournalJournal of the American Chemical Society
Volume127
Publication statusPublished - 2005

Cite this