Atomic XAFS as a Tool to Probe the Electronic Properties of Supported Noble Metal Nanoclusters

A.M.J. van der Eerden, M.H. Visser, T.A. Nijhuis, Y. Ikeda, M. Lepage, D.C. Koningsberger

Research output: Contribution to journalArticleAcademicpeer-review

Original languageUndefined/Unknown
Pages (from-to)3272-3273
Number of pages2
JournalJournal of the American Chemical Society
Volume127
Publication statusPublished - 2005

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