Assessing the influence of reference spectra on synthetic SAM classification results

C. Hecker, M. van der Meijde, H.M.A. van der Werff, F.D. van der Meer

Research output: Contribution to journal › Article › Academic › peer-review

Original language	Undefined/Unknown
Pages (from-to)	4162-4172
Number of pages	11
Journal	IEEE Transactions on Geoscience and Remote Sensing
Volume	46
Issue number	2008(12)
Publication status	Published - 2008

Cite this

@article{47934d13c2964c83b46cd0cd6b1c7ded,

title = "Assessing the influence of reference spectra on synthetic SAM classification results",

author = "C. Hecker and \{van der Meijde\}, M. and \{van der Werff\}, H.M.A. and \{van der Meer\}, F.D.",

year = "2008",

language = "Undefined/Unknown",

volume = "46",

pages = "4162--4172",

journal = "IEEE Transactions on Geoscience and Remote Sensing",

issn = "0196-2892",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "2008(12)",

}

TY - JOUR

T1 - Assessing the influence of reference spectra on synthetic SAM classification results

AU - Hecker, C.

AU - van der Meijde, M.

AU - van der Werff, H.M.A.

AU - van der Meer, F.D.

PY - 2008

Y1 - 2008

M3 - Article

SN - 0196-2892

VL - 46

SP - 4162

EP - 4172

JO - IEEE Transactions on Geoscience and Remote Sensing

JF - IEEE Transactions on Geoscience and Remote Sensing

IS - 2008(12)

ER -