Analysis of a SiO2/a-Si multilayer structures by ion beam methods and electron spin resonance

N. Tomozeiu, J.J. van Hapert, W.M. Arnold Bik, E.E.H. van Faassen, A.M. Vredenberg, F.H.P.M. Habraken

Research output: Contribution to journal › Article › Academic › peer-review

Cite this

@article{12166c38f271456595f6b371e25691f3,

title = "Analysis of a SiO2/a-Si multilayer structures by ion beam methods and electron spin resonance",

author = "N. Tomozeiu and \{van Hapert\}, J.J. and \{Arnold Bik\}, W.M. and \{van Faassen\}, E.E.H. and A.M. Vredenberg and F.H.P.M. Habraken",

year = "2001",

language = "Undefined/Unknown",

volume = "3",

pages = "563--570",

journal = "j. optoel. adv. mat",

}