An efficient proximity probing algorithm for metrology

F. Panahi, A.. Adler, A.F. van der Stappen, K. Goldberg

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proc. of the IEEE Conference on Automation Science and Engineering
Place of Publication	Madison, WI
Publisher	IEEE
Pages	342-349
Number of pages	8
DOIs	https://doi.org/10.1109/CoASE.2013.6653995
Publication status	Published - 17 Aug 2013

IEEE Conference on Automation Science and Engineering

Access to Document

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title = "An efficient proximity probing algorithm for metrology",

author = "F. Panahi and A.. Adler and {van der Stappen}, A.F. and K. Goldberg",

note = "IEEE Conference on Automation Science and Engineering",

year = "2013",

month = aug,

day = "17",

doi = "10.1109/CoASE.2013.6653995",

language = "English",

pages = "342--349",

booktitle = "Proc. of the IEEE Conference on Automation Science and Engineering",

publisher = "IEEE",

address = "United States",

}

TY - GEN

T1 - An efficient proximity probing algorithm for metrology

AU - Panahi, F.

AU - Adler, A..

AU - van der Stappen, A.F.

AU - Goldberg, K.

N1 - IEEE Conference on Automation Science and Engineering

PY - 2013/8/17

Y1 - 2013/8/17

U2 - 10.1109/CoASE.2013.6653995

DO - 10.1109/CoASE.2013.6653995

M3 - Conference contribution

SP - 342

EP - 349

BT - Proc. of the IEEE Conference on Automation Science and Engineering

PB - IEEE

CY - Madison, WI

ER -