An efficient proximity probing algorithm for metrology

F. Panahi, A.. Adler, A.F. van der Stappen, K. Goldberg

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageEnglish
    Title of host publicationProc. of the IEEE Conference on Automation Science and Engineering
    Place of PublicationMadison, WI
    PublisherIEEE
    Pages342-349
    Number of pages8
    DOIs
    Publication statusPublished - 17 Aug 2013

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