Aberrations and Penetration in In-Depth Confocal and Two-Photon Excitation Microscopy

C.J. de Grauw, P.L.Th.M. Frederix, H.C. Gerritsen

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review

Original language	Undefined/Unknown
Title of host publication	Confocal and Two-Photon Microscopy: Foundations, Applications and Avances
Editors	A. Doaspro
Place of Publication	New York, USA
Publisher	Wiley
Number of pages	17
ISBN (Print)	0-471-40920-0
Publication status	Published - 2001

Keywords

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title = "Aberrations and Penetration in In-Depth Confocal and Two-Photon Excitation Microscopy",

keywords = "Econometric and Statistical Methods: General, Geneeskunde (GENK), Geneeskunde(GENK), Algemeen onderzoek, Other medical specialities",

author = "{de Grauw}, C.J. and P.L.Th.M. Frederix and H.C. Gerritsen",

year = "2001",

language = "Undefined/Unknown",

isbn = "0-471-40920-0",

publisher = "Wiley",

editor = "A. Doaspro",

booktitle = "Confocal and Two-Photon Microscopy: Foundations, Applications and Avances",

}

TY - CHAP

T1 - Aberrations and Penetration in In-Depth Confocal and Two-Photon Excitation Microscopy

AU - de Grauw, C.J.

AU - Frederix, P.L.Th.M.

AU - Gerritsen, H.C.

PY - 2001

Y1 - 2001

KW - Econometric and Statistical Methods: General

KW - Geneeskunde (GENK)

KW - Geneeskunde(GENK)

KW - Algemeen onderzoek

KW - Other medical specialities

M3 - Chapter

SN - 0-471-40920-0

BT - Confocal and Two-Photon Microscopy: Foundations, Applications and Avances

A2 - Doaspro, A.

PB - Wiley

CY - New York, USA

ER -