Aberrations and Penetration in In-Depth Confocal and Two-Photon Excitation Microscopy

C.J. de Grauw, P.L.Th.M. Frederix, H.C. Gerritsen

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

Original languageUndefined/Unknown
Title of host publicationConfocal and Two-Photon Microscopy: Foundations, Applications and Avances
EditorsA. Doaspro
Place of PublicationNew York, USA
Number of pages17
ISBN (Print)0-471-40920-0
Publication statusPublished - 2001


  • Econometric and Statistical Methods: General
  • Geneeskunde (GENK)
  • Geneeskunde(GENK)
  • Algemeen onderzoek
  • Other medical specialities

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