A new method for the evaluation of solar cell parameters

A. Polman; W. G. J. H. M. van Sark; W. Sinke; F. W. Saris

doi:10.1016/0379-6787(86)90015-3

A new method for the evaluation of solar cell parameters

A. Polman, W. G. J. H. M. van Sark, W. Sinke, F. W. Saris

Section Energy and Resources

Research output: Contribution to journal › Article › Academic › peer-review

Abstract

A new method is presented that is capable of resolving the parameters in a double-exponential model with which the electrical characteristics of a crystalline-silicon solar cell are analyzed. This method gives not only open-circuit voltage, short-circuit current, fill factor and efficiency, but also diode saturations, light-generated current, series resistance and shunt resistance, all from one measurement under AM1 illumination. The experimental set-up used for I-V measurement and automated data handling is described. A fast computer fit procedure is introduced which resolves all parameters from one measurement. The errors in the parameter values obtained are studied. A comparison of these values for a number of I-V measurements of solar cells with different internal physical properties is given, in order to illustrate the utility of the method for unravelling various electrical processes in a solar cell.

Original language	English
Pages (from-to)	241-251
Journal	Solar Cells
Volume	17
Issue number	2-3
DOIs	https://doi.org/10.1016/0379-6787(86)90015-3
Publication status	Published - Apr 1986

Keywords

Energy Conversion Efficiency
Open Circuit Voltage
Short Circuit Currents
Solar Cells
Volt-Ampere Characteristics
Analog To Digital Converters
Annealing
Ion Implantation
Laser Applications
Solar Simulation

Access to Document

10.1016/0379-6787(86)90015-3

http://adsabs.harvard.edu/abs/1986SoCe...17..241P

Cite this

@article{950c799549a94ff491f232028f6f33c5,

title = "A new method for the evaluation of solar cell parameters",

abstract = "A new method is presented that is capable of resolving the parameters in a double-exponential model with which the electrical characteristics of a crystalline-silicon solar cell are analyzed. This method gives not only open-circuit voltage, short-circuit current, fill factor and efficiency, but also diode saturations, light-generated current, series resistance and shunt resistance, all from one measurement under AM1 illumination. The experimental set-up used for I-V measurement and automated data handling is described. A fast computer fit procedure is introduced which resolves all parameters from one measurement. The errors in the parameter values obtained are studied. A comparison of these values for a number of I-V measurements of solar cells with different internal physical properties is given, in order to illustrate the utility of the method for unravelling various electrical processes in a solar cell.",

keywords = "Energy Conversion Efficiency, Open Circuit Voltage, Short Circuit Currents, Solar Cells, Volt-Ampere Characteristics, Analog To Digital Converters, Annealing, Ion Implantation, Laser Applications, Solar Simulation",

author = "A. Polman and {van Sark}, {W. G. J. H. M.} and W. Sinke and Saris, {F. W.}",

year = "1986",

month = apr,

doi = "10.1016/0379-6787(86)90015-3",

language = "English",

volume = "17",

pages = "241--251",

journal = "Solar Cells",

issn = "1878-2655",

publisher = "Elsevier BV",

number = "2-3",

}

TY - JOUR

T1 - A new method for the evaluation of solar cell parameters

AU - Polman, A.

AU - van Sark, W. G. J. H. M.

AU - Sinke, W.

AU - Saris, F. W.

PY - 1986/4

Y1 - 1986/4

N2 - A new method is presented that is capable of resolving the parameters in a double-exponential model with which the electrical characteristics of a crystalline-silicon solar cell are analyzed. This method gives not only open-circuit voltage, short-circuit current, fill factor and efficiency, but also diode saturations, light-generated current, series resistance and shunt resistance, all from one measurement under AM1 illumination. The experimental set-up used for I-V measurement and automated data handling is described. A fast computer fit procedure is introduced which resolves all parameters from one measurement. The errors in the parameter values obtained are studied. A comparison of these values for a number of I-V measurements of solar cells with different internal physical properties is given, in order to illustrate the utility of the method for unravelling various electrical processes in a solar cell.

AB - A new method is presented that is capable of resolving the parameters in a double-exponential model with which the electrical characteristics of a crystalline-silicon solar cell are analyzed. This method gives not only open-circuit voltage, short-circuit current, fill factor and efficiency, but also diode saturations, light-generated current, series resistance and shunt resistance, all from one measurement under AM1 illumination. The experimental set-up used for I-V measurement and automated data handling is described. A fast computer fit procedure is introduced which resolves all parameters from one measurement. The errors in the parameter values obtained are studied. A comparison of these values for a number of I-V measurements of solar cells with different internal physical properties is given, in order to illustrate the utility of the method for unravelling various electrical processes in a solar cell.

KW - Energy Conversion Efficiency

KW - Open Circuit Voltage

KW - Short Circuit Currents

KW - Solar Cells

KW - Volt-Ampere Characteristics

KW - Analog To Digital Converters

KW - Annealing

KW - Ion Implantation

KW - Laser Applications

KW - Solar Simulation

U2 - 10.1016/0379-6787(86)90015-3

DO - 10.1016/0379-6787(86)90015-3

M3 - Article

SN - 1878-2655

VL - 17

SP - 241

EP - 251

JO - Solar Cells

JF - Solar Cells

IS - 2-3

ER -

A new method for the evaluation of solar cell parameters

Abstract

Keywords

Access to Document

Fingerprint

Cite this