A laboratory micro-CT setup for fast continuous scanning: applications for pore scale fluid flow research

Marijn Boone; Jeroen Van Stappen; Tom Bultreys; Matthieu Boone; Thomas De Schryver; Bert Masschaele; Denis Van Loo; Luc Van Hoorebeke; Veerle Cnudde

A laboratory micro-CT setup for fast continuous scanning: applications for pore scale fluid flow research

Marijn Boone, Jeroen Van Stappen, Tom Bultreys, Matthieu Boone, Thomas De Schryver, Bert Masschaele, Denis Van Loo, Luc Van Hoorebeke, Veerle Cnudde

non-UU output of DES-UU members

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Tomography of Materials and Structures, 2nd International conference, Abstracts
Editors	Bernard Long
Pages	74-74
Number of pages	1
Publication status	Published - 2015

Cite this

@inproceedings{444932601c0d4105bd0506336e009902,

title = "A laboratory micro-CT setup for fast continuous scanning: applications for pore scale fluid flow research",

author = "Marijn Boone and {Van Stappen}, Jeroen and Tom Bultreys and Matthieu Boone and {De Schryver}, Thomas and Bert Masschaele and {Van Loo}, Denis and {Van Hoorebeke}, Luc and Veerle Cnudde",

year = "2015",

language = "English",

isbn = "9782891468473",

pages = "74--74",

editor = "Bernard Long",

booktitle = "Tomography of Materials and Structures, 2nd International conference, Abstracts",

}

A laboratory micro-CT setup for fast continuous scanning: applications for pore scale fluid flow research. / Boone, Marijn; Van Stappen, Jeroen; Bultreys, Tom et al.
Tomography of Materials and Structures, 2nd International conference, Abstracts. ed. / Bernard Long. 2015. p. 74-74.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - A laboratory micro-CT setup for fast continuous scanning

T2 - applications for pore scale fluid flow research

AU - Boone, Marijn

AU - Van Stappen, Jeroen

AU - Bultreys, Tom

AU - Boone, Matthieu

AU - De Schryver, Thomas

AU - Masschaele, Bert

AU - Van Loo, Denis

AU - Van Hoorebeke, Luc

AU - Cnudde, Veerle

PY - 2015

Y1 - 2015

M3 - Conference contribution

SN - 9782891468473

SP - 74

EP - 74

BT - Tomography of Materials and Structures, 2nd International conference, Abstracts

A2 - Long, Bernard

ER -