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3D morphological characterization of silicium (Si) metal particles with X-ray microtomography

  • M GREGOIRE
  • , Veerle Cnudde
  • , Bert Masschaele
  • , Patric Jacobs
  • , E RIRARD

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageUndefined/Unknown
Title of host publicationtextmuTOM3D BVM/SBM Symposium on Electron X-ray Micro-Tomography and 3D Image Analysis
Publication statusPublished - 2006

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