3D morphological characterization of silicium (Si) metal particles with X-ray microtomography

M GREGOIRE, Veerle Cnudde, Bert Masschaele, Patric Jacobs, E RIRARD

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined/Unknown
Title of host publication	textmuTOM3D BVM/SBM Symposium on Electron X-ray Micro-Tomography and 3D Image Analysis
Publication status	Published - 2006

Cite this

@inproceedings{2b0d5efdc80b4e7e96d14b783525c52e,

title = "3D morphological characterization of silicium (Si) metal particles with X-ray microtomography",

author = "M GREGOIRE and Veerle Cnudde and Bert Masschaele and Patric Jacobs and E RIRARD",

year = "2006",

language = "Undefined/Unknown",

booktitle = "textmuTOM3D BVM/SBM Symposium on Electron X-ray Micro-Tomography and 3D Image Analysis",

}