The Utrecht-Management Identity Commitments Scale (U-MICS): Psychometric Properties in Various Cultural Contexts
- E. Crocetti (Invited speaker)
- J. Cieciuch (Invited speaker)
- C. Cao (Invited speaker)
- T.A. Klimstra (Invited speaker)
- C. Lin (Invited speaker)
- P.M. Matos (Invited speaker)
- O. Morsunbul (Invited speaker)
- O. Negru (Invited speaker)
- K Sugimura (Invited speaker)
- Grégoire Zimmermann (Invited speaker)
- Meeus, W. H. J. (Invited speaker)
Activity: Talk or presentation › Poster/paper presentation › Academic