Forgetting the future: Fading affect bias and content features of emotional future simulation in highly anxious individuals

  • N.D. Montijn (Presenter)
  • D. Sevenster (Invited speaker)
  • Engelhard, I. M. (Invited speaker)

Activity: Talk or presentation › Poster/paper presentation › Academic

Description

It is well-documented that the emotional intensity of autobiographical memory fades faster for negative than positive memories in healthy individuals. This so called fading affect bias (FAB) extends to future events and influences memory content. Several scientists have suggested that the FAB may be reversed in highly anxious individuals, as they are characterized by a negatively biased view of the future. In the current study, we examined whether highly anxious individuals show faster decay for positive than negative future memories, by studying episodic and semantic memory details. We used a novel paradigm that elaborates on recent work by Szpunar et al. (2012) on the FAB in future simulations. Results will be presented at the conference.
PeriodApr 2018
Event titleThe International conference on Learning and Memory: 35th Anniversary Celebration of the UC Irvine Center for the Neurobiology of Learning and Memory
Event typeConference
LocationHuntington Beach, United States, CaliforniaShow on map
Degree of RecognitionInternational